Extraction and Analysis of Mobility in Double Gate Junctionless Transistor

Y. V. Bhuvaneshwari, Abhinav Kranti. Extraction and Analysis of Mobility in Double Gate Junctionless Transistor. In 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017. pages 283-288, IEEE Computer Society, 2017. [doi]

Abstract

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