Xin Bi, Han Ding. Detection of Local Mura Defects in TFT-LCD Using Machine Vision. In Caihua Xiong, Honghai Liu, Yongan Huang, Youlun Xiong, editors, Intelligent Robotics and Applications, First International Conference, ICIRA 2008, Wuhan, China, October 15-17, 2008 Proceedings, Part I. Volume 5314 of Lecture Notes in Computer Science, pages 707-715, Springer, 2008. [doi]
@inproceedings{BiD08:0,
title = {Detection of Local Mura Defects in TFT-LCD Using Machine Vision},
author = {Xin Bi and Han Ding},
year = {2008},
doi = {10.1007/978-3-540-88513-9_76},
url = {http://dx.doi.org/10.1007/978-3-540-88513-9_76},
researchr = {https://researchr.org/publication/BiD08%3A0},
cites = {0},
citedby = {0},
pages = {707-715},
booktitle = {Intelligent Robotics and Applications, First International Conference, ICIRA 2008, Wuhan, China, October 15-17, 2008 Proceedings, Part I},
editor = {Caihua Xiong and Honghai Liu and Yongan Huang and Youlun Xiong},
volume = {5314},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-540-88512-2},
}