Yu Bi, Kees-Jan van der Kolk, Jorge Fernandez Villena, Luis Miguel Silveira, Nick van der Meijs. Fast statistical analysis of RC nets subject to manufacturing variabilities. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 31-37, IEEE, 2011. [doi]
Abstract is missing.