Reliability analysis and comparison of ring-PUF based on probabilistic models

Jingchang Bian, Zhengfeng Huang, Yankun Lin, Zhao Yang, Huaguo Liang, Tianming Ni. Reliability analysis and comparison of ring-PUF based on probabilistic models. Microelectronics Journal, 144:106072, February 2024. [doi]

Abstract

Abstract is missing.