Kun Bian, D. M. H. Walker, Sunil P. Khatri, Shayak Lahiri. Mixed structural-functional path delay test generation and compaction. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 7-12, IEEE, 2013. [doi]
@inproceedings{BianWKL13,
title = {Mixed structural-functional path delay test generation and compaction},
author = {Kun Bian and D. M. H. Walker and Sunil P. Khatri and Shayak Lahiri},
year = {2013},
doi = {10.1109/DFT.2013.6653575},
url = {http://dx.doi.org/10.1109/DFT.2013.6653575},
researchr = {https://researchr.org/publication/BianWKL13},
cites = {0},
citedby = {0},
pages = {7-12},
booktitle = {2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013},
publisher = {IEEE},
}