Kun Bian, D. M. H. Walker, Sunil P. Khatri, Shayak Lahiri. Mixed structural-functional path delay test generation and compaction. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 7-12, IEEE, 2013. [doi]
Abstract is missing.