Andrew Bicksler, Carmine Miccoli, Srinath Venkatesan. Physical Model and Characteristics of 3D NAND Memory Cell Metastability Issues under High Temperature Stress. In IEEE International Memory Workshop, IMW 2023, Monterey, CA, USA, May 21-24, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.