An embedded probabilistic extraction unit for on-chip jitter measurements - researchr publication authors

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Steven Bielby, Gordon W. Roberts. An embedded probabilistic extraction unit for on-chip jitter measurements. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 113-116, IEEE, 2015. [doi]

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