Steven Bielby, Gordon W. Roberts. An embedded probabilistic extraction unit for on-chip jitter measurements. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 113-116, IEEE, 2015. [doi]
@inproceedings{BielbyR15, title = {An embedded probabilistic extraction unit for on-chip jitter measurements}, author = {Steven Bielby and Gordon W. Roberts}, year = {2015}, doi = {10.1109/ISCAS.2015.7168583}, url = {http://dx.doi.org/10.1109/ISCAS.2015.7168583}, researchr = {https://researchr.org/publication/BielbyR15}, cites = {0}, citedby = {0}, pages = {113-116}, booktitle = {2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015}, publisher = {IEEE}, isbn = {978-1-4799-8391-9}, }