Analysis and Approach to Reduce Electrode Contact Artifacts in EIM

Rabia Bilal, W. Wang, Rupert Young. Analysis and Approach to Reduce Electrode Contact Artifacts in EIM. In David Al-Dabass, Alessandra Orsoni, Athanasios A. Pantelous, Gregorio Romero, Jesús Félez, editors, Proceedings of the UKSim 5th European Symposium on Computer Modeling and Simulation, EMS 2011, Madrid, Spain, November 16-18, 2011. pages 135-137, IEEE, 2011. [doi]

Authors

Rabia Bilal

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W. Wang

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Rupert Young

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