Rabia Bilal, W. Wang, Rupert Young. Analysis and Approach to Reduce Electrode Contact Artifacts in EIM. In David Al-Dabass, Alessandra Orsoni, Athanasios A. Pantelous, Gregorio Romero, Jesús Félez, editors, Proceedings of the UKSim 5th European Symposium on Computer Modeling and Simulation, EMS 2011, Madrid, Spain, November 16-18, 2011. pages 135-137, IEEE, 2011. [doi]
@inproceedings{BilalWY11,
title = {Analysis and Approach to Reduce Electrode Contact Artifacts in EIM},
author = {Rabia Bilal and W. Wang and Rupert Young},
year = {2011},
doi = {10.1109/EMS.2011.70},
url = {http://doi.ieeecomputersociety.org/10.1109/EMS.2011.70},
researchr = {https://researchr.org/publication/BilalWY11},
cites = {0},
citedby = {0},
pages = {135-137},
booktitle = {Proceedings of the UKSim 5th European Symposium on Computer Modeling and Simulation, EMS 2011, Madrid, Spain, November 16-18, 2011},
editor = {David Al-Dabass and Alessandra Orsoni and Athanasios A. Pantelous and Gregorio Romero and Jesús Félez},
publisher = {IEEE},
isbn = {978-1-4673-0060-5},
}