David M. Binkley, Matthias Bucher, Daniel Foty. Design-oriented characterization of CMOS over the continuum of inversion level and channel length. In Proceedings of the 2000 7th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2000, Jounieh, Lebanon, December 17-20, 2000. pages 161-164, IEEE, 2000. [doi]
Abstract is missing.