Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis - researchr publication authors

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Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui. Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-10, IEEE, 2020. [doi]

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