Sounil Biswas, Ronald D. Blanton. Maintaining Accuracy of Test Compaction through Adaptive Re-learning. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 257-263, IEEE Computer Society, 2009. [doi]
@inproceedings{BiswasB09,
title = {Maintaining Accuracy of Test Compaction through Adaptive Re-learning},
author = {Sounil Biswas and Ronald D. Blanton},
year = {2009},
doi = {10.1109/VTS.2009.59},
url = {http://dx.doi.org/10.1109/VTS.2009.59},
tags = {testing},
researchr = {https://researchr.org/publication/BiswasB09},
cites = {0},
citedby = {0},
pages = {257-263},
booktitle = {27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3598-2},
}