Maintaining Accuracy of Test Compaction through Adaptive Re-learning - researchr publication

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Sounil Biswas, Ronald D. Blanton. Maintaining Accuracy of Test Compaction through Adaptive Re-learning. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 257-263, IEEE Computer Society, 2009. [doi]

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