Sounil Biswas, John Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee. Innovative practices session 5C: Machine learning and data analysis in test. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1, IEEE, 2014. [doi]
Abstract is missing.