Sounil Biswas, Kumar N. Dwarakanath, R. D. (Shawn) Blanton. Generalized Sensitization using Fault Tuples. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 297-303, IEEE Computer Society, 2004. [doi]
@inproceedings{BiswasDB04,
title = {Generalized Sensitization using Fault Tuples},
author = {Sounil Biswas and Kumar N. Dwarakanath and R. D. (Shawn) Blanton},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/vts/2004/2134/00/21340297abs.htm},
researchr = {https://researchr.org/publication/BiswasDB04},
cites = {0},
citedby = {0},
pages = {297-303},
booktitle = {22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2134-7},
}