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Generalized Sensitization using Fault Tuples

Sounil Biswas, Kumar N. Dwarakanath, R. D. (Shawn) Blanton. Generalized Sensitization using Fault Tuples. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 297-303, IEEE Computer Society, 2004. [doi]

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