Susmit Biswas, Gang Wang, Tzvetan S. Metodi, Ryan Kastner, Frederic T. Chong. Combining static and dynamic defect-tolerance techniques for nanoscale memory systems. In Georges G. E. Gielen, editor, 2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA. pages 773-778, IEEE, 2007. [doi]
@inproceedings{BiswasWMKC07,
title = {Combining static and dynamic defect-tolerance techniques for nanoscale memory systems},
author = {Susmit Biswas and Gang Wang and Tzvetan S. Metodi and Ryan Kastner and Frederic T. Chong},
year = {2007},
doi = {10.1145/1326073.1326235},
url = {http://doi.acm.org/10.1145/1326073.1326235},
researchr = {https://researchr.org/publication/BiswasWMKC07},
cites = {0},
citedby = {0},
pages = {773-778},
booktitle = {2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA},
editor = {Georges G. E. Gielen},
publisher = {IEEE},
isbn = {1-4244-1382-6},
}