Susmit Biswas, Gang Wang, Tzvetan S. Metodi, Ryan Kastner, Frederic T. Chong. Combining static and dynamic defect-tolerance techniques for nanoscale memory systems. In Georges G. E. Gielen, editor, 2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA. pages 773-778, IEEE, 2007. [doi]
Abstract is missing.