R. D. (Shawn) Blanton. IDDQ-Testability of Tree Circuits. In 12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India. pages 78-86, IEEE Computer Society, 1999. [doi]
@inproceedings{Blanton99,
title = {IDDQ-Testability of Tree Circuits},
author = {R. D. (Shawn) Blanton},
year = {1999},
doi = {10.1109/ICVD.1999.745128},
url = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1999.745128},
tags = {testing},
researchr = {https://researchr.org/publication/Blanton99},
cites = {0},
citedby = {0},
pages = {78-86},
booktitle = {12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India},
publisher = {IEEE Computer Society},
}