IDDQ-Testability of Tree Circuits

R. D. (Shawn) Blanton. IDDQ-Testability of Tree Circuits. In 12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India. pages 78-86, IEEE Computer Society, 1999. [doi]

Abstract

Abstract is missing.