Image analysis methods for solderball inspection in integrated circuit manufacturing

Wolf-Ekkehard Blanz, Jorge L. C. Sanz, Eric B. Hinkle. Image analysis methods for solderball inspection in integrated circuit manufacturing. IEEE Transactions on Robotics, 4(2):129-139, 1988. [doi]

Authors

Wolf-Ekkehard Blanz

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Jorge L. C. Sanz

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Eric B. Hinkle

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