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One-Shot Grading: Design and Development of an Automatic Answer Sheet Checker

A. Blattler, Teppakorn Sittiwanchai, P. Tareram, W. Chenvigyakit, C. Sila-ars. One-Shot Grading: Design and Development of an Automatic Answer Sheet Checker. In IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2023, Singapore, December 18-21, 2023. pages 562-566, IEEE, 2023. [doi]

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A. Blattler

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Teppakorn Sittiwanchai

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P. Tareram

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W. Chenvigyakit

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C. Sila-ars

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