A. Blattler, Teppakorn Sittiwanchai, P. Tareram, W. Chenvigyakit, C. Sila-ars. One-Shot Grading: Design and Development of an Automatic Answer Sheet Checker. In IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2023, Singapore, December 18-21, 2023. pages 562-566, IEEE, 2023. [doi]
Abstract is missing.