A. Blattler, Teppakorn Sittiwanchai, P. Tareram, W. Chenvigyakit, C. Sila-ars. One-Shot Grading: Design and Development of an Automatic Answer Sheet Checker. In IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2023, Singapore, December 18-21, 2023. pages 562-566, IEEE, 2023. [doi]
@inproceedings{BlattlerSTCS23,
title = {One-Shot Grading: Design and Development of an Automatic Answer Sheet Checker},
author = {A. Blattler and Teppakorn Sittiwanchai and P. Tareram and W. Chenvigyakit and C. Sila-ars},
year = {2023},
doi = {10.1109/IEEM58616.2023.10406437},
url = {https://doi.org/10.1109/IEEM58616.2023.10406437},
researchr = {https://researchr.org/publication/BlattlerSTCS23},
cites = {0},
citedby = {0},
pages = {562-566},
booktitle = {IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2023, Singapore, December 18-21, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2315-3},
}