Experimental Results for Current-Based Analog Scan

Thomas M. Bocek, Tuyen D. Vu, Mani Soma, Jason D. Moffatt. Experimental Results for Current-Based Analog Scan. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 768-775, IEEE Computer Society, 1997.

Abstract

Abstract is missing.