Shraddha Bodhe, Enamul Amyeen, Irith Pomeranz, Srikanth Venkataraman. Diagnostic Fail Data Minimization Using an N-Cover Algorithm. IEEE Trans. VLSI Syst., 24(3):1198-1202, 2016. [doi]
@article{BodheAPV16,
title = {Diagnostic Fail Data Minimization Using an N-Cover Algorithm},
author = {Shraddha Bodhe and Enamul Amyeen and Irith Pomeranz and Srikanth Venkataraman},
year = {2016},
doi = {10.1109/TVLSI.2015.2432717},
url = {http://dx.doi.org/10.1109/TVLSI.2015.2432717},
researchr = {https://researchr.org/publication/BodheAPV16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {24},
number = {3},
pages = {1198-1202},
}