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    Test theory for assessing IR test collections

    David Bodoff, Pu Li. Test theory for assessing IR test collections. In Wessel Kraaij, Arjen P. de Vries, Charles L. A. Clarke, Norbert Fuhr, Noriko Kando, editors, SIGIR 2007: Proceedings of the 30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, Amsterdam, The Netherlands, July 23-27, 2007. pages 367-374, ACM, 2007. [doi]

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    David Bodoff

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    Pu Li

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