David Bodoff, Pu Li. Test theory for assessing IR test collections. In Wessel Kraaij, Arjen P. de Vries, Charles L. A. Clarke, Norbert Fuhr, Noriko Kando, editors, SIGIR 2007: Proceedings of the 30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, Amsterdam, The Netherlands, July 23-27, 2007. pages 367-374, ACM, 2007. [doi]
@inproceedings{BodoffL07,
title = {Test theory for assessing IR test collections},
author = {David Bodoff and Pu Li},
year = {2007},
doi = {10.1145/1277741.1277805},
url = {http://doi.acm.org/10.1145/1277741.1277805},
tags = {testing},
researchr = {https://researchr.org/publication/BodoffL07},
cites = {0},
citedby = {0},
pages = {367-374},
booktitle = {SIGIR 2007: Proceedings of the 30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, Amsterdam, The Netherlands, July 23-27, 2007},
editor = {Wessel Kraaij and Arjen P. de Vries and Charles L. A. Clarke and Norbert Fuhr and Noriko Kando},
publisher = {ACM},
isbn = {978-1-59593-597-7},
}