David Bodoff, Pu Li. Test theory for assessing IR test collections. In Wessel Kraaij, Arjen P. de Vries, Charles L. A. Clarke, Norbert Fuhr, Noriko Kando, editors, SIGIR 2007: Proceedings of the 30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, Amsterdam, The Netherlands, July 23-27, 2007. pages 367-374, ACM, 2007. [doi]
Abstract is missing.