USB2.0 Logic Built In Self Test Methodology

Keanhong Boey, Kok Sing Yap, Wai Mun Ng. USB2.0 Logic Built In Self Test Methodology. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 266, IEEE Computer Society, 2008. [doi]

Abstract

Abstract is missing.