Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays - researchr publication authors

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Christian Bogner, Tibor Grasser, Michael Waltl, Hans Reisinger, Christian Schlünder. Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 1-8, IEEE, 2022. [doi]

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