Christian Bogner, Tibor Grasser, Michael Waltl, Hans Reisinger, Christian Schlünder. Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 1-8, IEEE, 2022. [doi]
@inproceedings{BognerGWRS22,
title = {Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays},
author = {Christian Bogner and Tibor Grasser and Michael Waltl and Hans Reisinger and Christian Schlünder},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764496},
url = {https://doi.org/10.1109/IRPS48227.2022.9764496},
researchr = {https://researchr.org/publication/BognerGWRS22},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}