Christian Bogner, Christian Schlünder, Michael Waltl, Hans Reisinger, Tibor Grasser. Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-7, IEEE, 2023. [doi]
Abstract is missing.