Analog IC Design in Ultra-Thin Oxide CMOS Technologies With Significant Direct Tunneling-Induced Gate Current

Eric Bohannon, Clyde Washburn, Ponnathpur R. Mukund. Analog IC Design in Ultra-Thin Oxide CMOS Technologies With Significant Direct Tunneling-Induced Gate Current. IEEE Trans. on Circuits and Systems, 58-I(4):645-653, 2011. [doi]

Abstract

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