A Single-Temperature Trimming Technique for MOS-Input Operational Amplifiers Achieving 0.33 μ V/°C Offset Drift - researchr publication bibliographies

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Muhammed Bolatkale, Michiel A. P. Pertijs, Wilko J. Kindt, Johan H. Huijsing, Kofi A. A. Makinwa. A Single-Temperature Trimming Technique for MOS-Input Operational Amplifiers Achieving 0.33 μ V/°C Offset Drift. J. Solid-State Circuits, 46(9):2099-2107, 2011. [doi]

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