Cristiana Bolchini, Luca Cassano. Machine learning-based techniques for incremental functional diagnosis: A comparative analysis. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. pages 246-251, IEEE, 2014. [doi]
Abstract is missing.