Cristiana Bolchini, Luca Cassano, Antonio Miele, Alessandro Nazzari, Dario Passarello. Analyzing the Reliability of Alternative Convolution Implementations for Deep Learning Applications. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.