Luciano Bonaria, M. Raganato, Matteo Sonza Reorda, Giovanni Squillero. A Dynamic Greedy Test Scheduler for Optimizing Probe Motion in In-Circuit Testers. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-2, IEEE, 2019. [doi]
@inproceedings{BonariaRRS19,
title = {A Dynamic Greedy Test Scheduler for Optimizing Probe Motion in In-Circuit Testers},
author = {Luciano Bonaria and M. Raganato and Matteo Sonza Reorda and Giovanni Squillero},
year = {2019},
doi = {10.1109/ETS.2019.8791519},
url = {https://doi.org/10.1109/ETS.2019.8791519},
researchr = {https://researchr.org/publication/BonariaRRS19},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1173-5},
}