Luciano Bonaria, M. Raganato, Matteo Sonza Reorda, Giovanni Squillero. A Dynamic Greedy Test Scheduler for Optimizing Probe Motion in In-Circuit Testers. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-2, IEEE, 2019. [doi]
Abstract is missing.