Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint - researchr publication authors

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Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch. Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 488-493, IEEE Computer Society, 2003. [doi]

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