Tom Bonifield, Honglin Guo, Jeff West, Hisashi Shichijo, Talha Tahir. High Frequency TDDB of Reinforced Isolation Dielectric Systems. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.