Cross-coupling in 65nm fully integrated EDGE System On Chip Design and cross-coupling prevention of complex 65nm SoC - researchr publication authors

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Pierre-Henri Bonnaud, Grit Sommer. Cross-coupling in 65nm fully integrated EDGE System On Chip Design and cross-coupling prevention of complex 65nm SoC. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1045-1050, IEEE, 2009. [doi]

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