Pierre-Henri Bonnaud, Grit Sommer. Cross-coupling in 65nm fully integrated EDGE System On Chip Design and cross-coupling prevention of complex 65nm SoC. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1045-1050, IEEE, 2009. [doi]
@inproceedings{BonnaudS09,
title = {Cross-coupling in 65nm fully integrated EDGE System On Chip Design and cross-coupling prevention of complex 65nm SoC},
author = {Pierre-Henri Bonnaud and Grit Sommer},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090818&count=326&index=204},
tags = {design},
researchr = {https://researchr.org/publication/BonnaudS09},
cites = {0},
citedby = {0},
pages = {1045-1050},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}