VINCI: Secure Test of a VLSI High-Speed Encryption System

H. Bonnenberg, Andreas Curiger, Norbert Felber, Hubert Kaeslin, R. Zimmermann, Wolfgang Fichtner. VINCI: Secure Test of a VLSI High-Speed Encryption System. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 782-790, IEEE Computer Society, 1993.

Abstract

Abstract is missing.