A generic framework for defect detection on vessel structures based on image saliency

Francisco Bonnín-Pascual, Alberto Ortiz. A generic framework for defect detection on vessel structures based on image saliency. In 21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016, Berlin, Germany, September 6-9, 2016. pages 1-4, IEEE, 2016. [doi]

Authors

Francisco Bonnín-Pascual

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Alberto Ortiz

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