Francisco Bonnín-Pascual, Alberto Ortiz. A generic framework for defect detection on vessel structures based on image saliency. In 21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016, Berlin, Germany, September 6-9, 2016. pages 1-4, IEEE, 2016. [doi]
@inproceedings{Bonnin-PascualO16, title = {A generic framework for defect detection on vessel structures based on image saliency}, author = {Francisco Bonnín-Pascual and Alberto Ortiz}, year = {2016}, doi = {10.1109/ETFA.2016.7733668}, url = {http://dx.doi.org/10.1109/ETFA.2016.7733668}, researchr = {https://researchr.org/publication/Bonnin-PascualO16}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016, Berlin, Germany, September 6-9, 2016}, publisher = {IEEE}, isbn = {978-1-5090-1314-2}, }