Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance

Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis. Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance. IEEE Trans. VLSI Syst., 26(8):1438-1451, 2018. [doi]

Abstract

Abstract is missing.