David Bordoley, Hieu Nguyen, Mani Soma. A statistical study of the effectiveness of BIST jitter measurement techniques. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 100-107, IEEE Computer Society, 2005.
@inproceedings{BordoleyNS05,
title = {A statistical study of the effectiveness of BIST jitter measurement techniques},
author = {David Bordoley and Hieu Nguyen and Mani Soma},
year = {2005},
researchr = {https://researchr.org/publication/BordoleyNS05},
cites = {0},
citedby = {0},
pages = {100-107},
booktitle = {2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-9254-X},
}